首页> 外文OA文献 >Doping dependence of spin dynamics of drifting electrons in GaAs bulks
【2h】

Doping dependence of spin dynamics of drifting electrons in GaAs bulks

机译:Gaas体积中漂移电子自旋动力学的掺杂依赖性

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

We study the effect of the impurity density on lifetimes and relaxationlengths of electron spins in the presence of a static electric field in an-type GaAs bulk. The transport of electrons and the spin dynamics aresimulated by using a semiclassical Monte Carlo approach, which takes intoaccount the intravalley scattering mechanisms of warm electrons in thesemiconductor material. Spin relaxation is considered through theD'yakonov-Perel mechanism, which is the dominant mechanism in III-Vsemiconductors. The evolution of spin polarization is analyzed by computing thelifetimes and depolarization lengths as a function of the doping density in therange 10^{13} - 10^{16} cm^{-3}, for different values of the amplitude of thestatic electric field (0.1 - 1.0 kV/cm). We find an increase of the electronspin lifetime as a function of the doping density, more evident for latticetemperatures lower than 150 K. Moreover, at very low intensities of the drivingfield, the spin depolarization length shows a nonmonotonic behaviour with thedensity. At the room temperature, the spin lifetimes and depolarization lengthsare nearly independent on the doping density. The underlying physics isanalyzed.
机译:我们研究了在Ga型体中存在静电场的情况下,杂质密度对电子自旋寿命和弛豫长度的影响。通过使用半经典的蒙特卡洛方法模拟电子的传输和自旋动力学,该方法考虑了这些半导体材料中热电子的谷内散射机理。通过D'yakonov-Perel机制来考虑自旋弛豫,该机制是III-V型半导体中的主要机制。通过计算寿命和去极化长度与掺杂密度在10 ^ {13}-10 ^ {16} cm ^ {-3}范围内的函数的关系,来分析自旋极化的演变(0.1-1.0 kV / cm)。我们发现电子旋转寿命的增加是掺杂密度的函数,对于低于150 K的晶格温度更明显。此外,在非常低的驱动场强度下,自旋去极化长度显示出密度的非单调行为。在室温下,自旋寿命和去极化长度几乎与掺杂密度无关。分析了基础物理。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号